Fully automatic wafer probe station
Suitable for 4-12 inch wafer testing, it can provide different testing environment configurations such as high and low temperature, high voltage, and low leakage The device is simple to use, with
CP300 semi-automatic alignment probe station
Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.
CRX-SM Low temperature superconducting vacuum probe station
Temperature range 8K-300K; IV/CV/Microwave/Optoelectronic Experimental Testing/Superconducting Vertical Magnetic Field Measurement/Low Temperature Testing
CRX-Closed cycle low-temperature probe station
Temperature range 4.5K-350K; IV/CV/Microwave/Optoelectronic Experimental Testing/Superconducting Vertical Magnetic Field Measurement/Low Temperature Testing
CS-4 small probe station
Small size, modular design, light weight, up to 6 inch wafer, for I-V/C-V, PIV, optoelectronic tests, applicable to glove box
CL-6 middle-sized probe station
Modular design, precise screw drive structure, up to 8 inch wafer, upgradable for RF test, high current test and laser repair applications.
CH-8-D
CINDBEST CH-8-D 雙面點針探針臺可用于晶圓和PCB板測試，用于需要正面和背面同時扎針，以實現各種光/電性能測試需求的測試設備。該定制探針臺具有優良的機械系統，穩定的結構，符合人體工程學，以及多項升級功能。可廣泛應用于集成電路、Wafer ， LED、LCD、太陽能電池等行業的制造和研究領域。
CH-8 large-sized comprehensive probe station
Modular design, seamless upgrade, up to 12 inch wafer. Quick and fine-tuning lift function for chuck stage. Capable for Wafer test, PCB/IC test, RF test, high voltage and c
CH-12 large-sized comprehensive probe station
Modular design, seamless upgrade, up to 12 inch wafer, high precise screw drive structure, linear movement, quick and fine-tuning lift function for chuck stage, capable for Wafer test, PC
